New paper in ACS Applied Materials & Interfaces

"Combining TEM, AFM, and Profilometry for Quantitative Topography Characterization Across All Scales" has appeared in ACS Applied Materials & Interfaces.



The results described in this paper were obtained in collaboration with the group of Tevis Jacobs at the University of Pittsburgh and describes characterization of surface roughness over an unprecedented eight orders of magnitude in length scale. It can be accessed here:


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